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Night Shift NS27-1005.LERecalls & reported problems

Advanced Brain Monitoring, Inc. · Night Shift LE Device Kit · Class 2

Data updated Oct 18, 2026 from official FDA records · Editorial policy

Adverse event reports
1
Deaths reported
0
Injuries reported
0
Recalls naming it
0

Summary

The FDA's MAUDE database contains 1 adverse event report that list this exact device (DI 00850015266195), received between Dec 8, 2025 and Dec 8, 2025 — classified as 1 malfunction.

The most frequently reported specific device problem is “Overheating of Device” (1 report).

Reports come from manufacturers, hospitals and patients and are not verified by the FDA. A report does not prove the device caused the event, and counts can't be used to compare devices or estimate failure rates. What reports can and can't tell you · How this data works · Data updated Oct 18, 2026.

Reports received per month

Nov 2023: 0 reportsDec 2023: 0 reportsJan 2024: 0 reportsFeb 2024: 0 reportsMar 2024: 0 reportsApr 2024: 0 reportsMay 2024: 0 reportsJun 2024: 0 reportsJul 2024: 0 reportsAug 2024: 0 reportsSep 2024: 0 reportsOct 2024: 0 reportsNov 2024: 0 reportsDec 2024: 0 reportsJan 2025: 0 reportsFeb 2025: 0 reportsMar 2025: 0 reportsApr 2025: 0 reportsMay 2025: 0 reportsJun 2025: 0 reportsJul 2025: 0 reportsAug 2025: 0 reportsSep 2025: 0 reportsOct 2025: 0 reportsNov 2025: 0 reportsDec 2025: 1 reportsJan 2026: 0 reportsFeb 2026: 0 reportsMar 2026: 0 reportsApr 2026: 0 reportsMay 2026: 0 reportsJun 2026: 0 reportsJul 2026: 0 reportsAug 2026: 0 reportsSep 2026: 0 reportsOct 2026: 0 reports2024202520261
Last 36 months. The most recent month may be incomplete.

Most reported problems

Device problems

  • Overheating of Device1
  • Thermal Decomposition of Device1

Patient problems

  • No Clinical Signs, Symptoms or Conditions1

Recent adverse event reports

The 1 most recent of 1 reports, in the reporter's own words as published by the FDA.

  • MalfunctionDec 8, 2025Thermal Decomposition of Device; Overheating of Device; Thermal Decomposition of Device; Overheating of Device

    THE USER REPORTED THAT THE NIGHT SHIFT DEVICE WAS BURNING WHILE CHARGING, AND THAT THE CHARGING CABLE CONNECTOR MELTED/FUSED TO THE CHARGING PORT ON THE DEVICE. THE USER REPORTED THAT THERE WAS NO INJURY CAUSED BY THE INCIDENT. VISUAL INSPECTION OF THE DEVICE FOUND THAT THE ENCLOSURE PLASTIC AROUND THE CHARGING PORT WAS WARPED AND A PORTION OF THE USB-C CONNECTOR OF THE CHARGING CABLE WAS FUSED TO THE CHARGING PORT. THERMAL DAMAGE WAS FOUND ON THE PCB, LOCALIZED AROUND THE USB CHARGING PORT. THE INTERNAL BATTERY WAS INTACT BUT HAD EXPANDED SLIGHTLY DUE TO HEAT. THE MELTED CHARGING CABLE CONNECTOR COULD NOT BE REMOVED FROM THE CHARGING PORT TO INSPECT THE INSIDE OF THE PORT FOR DEBRIS/CORROSION, BUT THE INCIDENT IS CONSISTENT WITH THE TYPES OF THERMAL INCIDENTS ASSOCIATED WITH USB-C CONNECTORS WHEN CONTAMINATION, MOISTURE, OR METALLIC DEBRIS CAUSES AN ELECTRICAL SHORT DURING CHARGING. THE USER STATED THAT THE DEVICE WAS CHARGED IN A BATHROOM USING THE ORIGINAL CHARGING CABLE PLUGGED INTO A MULTIPORT USB FAST CHARGER. THE USER WAS UNABLE TO PROVIDE THE REMAINING PORTION OF THE CHARGING CABLE FOR INVESTIGATION. THE EXACT CAUSE OF THE INCIDENT COULD NOT BE DETERMINED.

    Patient problems: No Clinical Signs, Symptoms or Conditions

    MAUDE report 23743303 ↗

Sources and updates

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